Test compression technology was invented to address the problem of escalating test-pattern size. Compression allows more test vectors to be applied to an IC in a shorter time and with fewer tester ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Timely delivery of highly reliable semiconductor products to market is essential to success in today’s competitive business environment. As if following through on this objective were not already ...

With every passing day the Mule provides opportunities beyond our original expectations. Since the 467ci engine belongs to HPP editor Tom DeMauro, it is at our beck and call. This affords HPP the ...

About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

Micropillar compression testing [1] is fast emerging as a viable alternative to nanoindentation, for the measurement of mechanical properties and deformation behavior of small volumes and thin films.

This video demonstrates the compression test performed on a milk crate using Instron universal testing machine. Compression testing was performed to measure the strength of the milk crate. Instron ...

During the late 1960s and most of the 1970s, the composites industry was absorbing the impact of what was then the recent introduction of carbon fiber. The resulting composites exhibited both high ...