Utilizing Index of Refraction Monitors in Biopharmaceutical Downstream Processing and Purification When the FDA published the 2003 document, “Pharmaceutical Current Good Manufacturing Practices (CGMPs ...
Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...
Researchers reported a novel technology enhancing the high transparency of refractive polymer film via a one-step vapor deposition process. The sulfur-containing polymer (SCP) film produced by ...
The Fisher Scientific™ Abbe Bench-top Refractometer measures refractive indices of liquid and solid samples at D-line (589nm), featuring a combination of the Brix and refractive index (nD) ...
NanoCalc Reflectometry System Analyzes Wide Range of Optical Layer Thicknesses. Dunedin, Fla., November 2006 - The NanoCalc Thin Film Reflectometry System from Ocean Optics measures the thickness of ...
(Nanowerk News) Researchers from North Carolina State University have developed a dielectric film that has optical and electrical properties similar to air, but is strong enough to be incorporated ...
Block diagram of Faraday effect measurement system using dual-comb spectroscopy. The signal comb (red line) passes through the sample and is superposed with the local comb (blue line). The vertical ...
The Rudolph Research J257 Wide Range Refractometer was developed by working together with laboratory refractometer users from the polymer, petroleum, petrochemical, pharmaceutical and essential oil ...
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