DigRF (www.digrf.com) is emerging as a standard serial digital interface between 2.5G and 3G cell-phone baseband and RF chips. The standard has the support of RF IC, baseband IC, and cell-phone ...
New family of PhazorRFâ high frequency probe cards, breaking industry frequency and performance benchmarks targeting next generation automotive radar, 5G and 6G platforms. PhazorRF's ultra-low loss, ...
An accumulation of factors within a test system can produce unacceptable waveform distortion, casting doubt on the validity of the test results. Present RF immunity standards do not stipulate waveform ...
Santa Clara, Calif. — Agilent Technologies Inc. has claimed the industry's first Digital Radio Frequency (DigRF) V4 test solution. It enables comprehensive stimulus and analysis for developers of ...
Langer EMV-Technik GmbH has introduced a new SX1 near-field probe set with a new member of the SX near-field probe family. SX probes in the set have probe-head high measurement resolution to allow a ...
On-wafer probing techniques have become indispensable in the precise characterisation of semiconductor devices operating in the microwave and terahertz regions. These techniques enable the direct ...
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