Generic test and repair approaches to embedded memory have hit their limit. Smaller feature sizes, such as 130 nm and 90 nm, have made it possible to embed multiple megabits of memory into a single ...

Optimized memory test and repair algorithms efficiently address new memory defects, including process variation faults and resistive faults, at 20 nanometers (nm) and below New hierarchical ...

Like a bad vending machine that takes your money without coughing up the product, a damaged memory card can seemingly eat your data. In some cases, you may be able to stick your hand down the card's ...

Three-dimensional (3D) memory integration marks a significant advancement in semiconductor technology, enabling higher device densities and enhanced performance for modern applications. However, the ...

The burgeoning electronic content in automobiles has allowed numerous innovations to help improve the safety and comfort of cars and at the same time optimize the overall cost of automobiles. This has ...

The “SysInfoCap.exe High Memory” error is widely reported on HP laptops and desktops, particularly when the system becomes ...